AutoPVS1: An automatic classification tool for PVS1 interpretation of null variants
نویسندگان
چکیده
منابع مشابه
An Automatic Fingerprint Classification Algorithm
Manual fingerprint classification algorithms are very time consuming, and usually not accurate. Fast and accurate fingerprint classification is essential to each AFIS (Automatic Fingerprint Identification System). This paper investigates a fingerprint classification algorithm that reduces the complexity and costs associated with the fingerprint identification procedure. A new structural algorit...
متن کاملAn Automatic Fingerprint Classification Algorithm
Manual fingerprint classification algorithms are very time consuming, and usually not accurate. Fast and accurate fingerprint classification is essential to each AFIS (Automatic Fingerprint Identification System). This paper investigates a fingerprint classification algorithm that reduces the complexity and costs associated with the fingerprint identification procedure. A new structural algorit...
متن کاملAN-EUL method for automatic interpretation of potential field data in unexploded ordnances (UXO) detection
We have applied an automatic interpretation method of potential data called AN-EUL in unexploded ordnance (UXO) prospective which is indeed a combination of the analytic signal and the Euler deconvolution approaches. The method can be applied for both magnetic and gravity data as well for gradient surveys based upon the concept of the structural index (SI) of a potential anomaly which is relate...
متن کاملPASTEC: An Automatic Transposable Element Classification Tool
SUMMARY The classification of transposable elements (TEs) is key step towards deciphering their potential impact on the genome. However, this process is often based on manual sequence inspection by TE experts. With the wealth of genomic sequences now available, this task requires automation, making it accessible to most scientists. We propose a new tool, PASTEC, which classifies TEs by searchin...
متن کاملEvolving an Automatic Defect Classification Tool
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training data and its high dimensionality in the feature space render the defect-classification task hard to solve. In addition, the continuously changing environment—comprising both new and obsolescent defect types encounter...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Human Mutation
سال: 2020
ISSN: 1059-7794,1098-1004
DOI: 10.1002/humu.24051